• Chemical identification of liquids, gases and powders
  • Quality verification of incoming/outgoing materials
  • Microanalysis of small sections of materials to identify contaminants
  • Analysis of thin films and coatings
  • Monitoring of chemical adsorption/absorption properties of materials

Specifications and Features

  • 400 to 4000 cm-1 reciprocal wavelength range
  • DTGS detector
  • Nicolet Omnic software and analysis libraries
  • Atmospheric suppression
  • Single bounce diamond ATR attachment 650 to 4000 cm-1
  • 1” to 8” MappIR (Pike Technologies) wafer mapping system
  • MappIR reflectance and transmission modes

Documents and Links