Applications
- Thin film thickness and properties measurement (n and k).
- Generally on Si or glass slides, but can be other substrates.
- Monitor thin film stack properties.
- Build custom thin film measurement recipes for your samples.
Specifications and Features
- Thickness range: 15nm-250um
- Wavelength range: 380-1700 nm
- Flattening filter (for highly reflective substrates)
- Integrated spectrometer/light source unit
- FILMeasure 9 software
- SS-3 sample stage with fiber optic cable
- Reflectance and thickness standards
- Library with over 130 materials, along with access to 100's more
- Output data to CSV files, images, ....
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